2018 MRS Spring Meeting - Tagged with Symposia>CM01: Exploring Nanoscale Physical Properties Of Materials Via Local Probes

CM01.01.01 : Kelvin Probe Force Microscopy of Molecular Adsorption/Desorption on Nanowires

10:30 AM–11:00 AM Apr 3, 2018

Thomas ThundatUniversity of Alberta, School of Dentistry

CM01.01.02 : The Relationship Between Carbon Nanotube Structure, Dielectric Environment and Physical Properties Revealed by Spectrally-Resolved Photocurrent Microscopy

11:00 AM–11:15 AM Apr 3, 2018

PCC North, 100 Level, Room 131 B

Mitchell SengerStudent atOregon State University Dept. of Physics

CM01.01.03 : Method for Determining the Electrical Shape of a Scanning Probe Microscope Tip

11:15 AM–11:30 AM Apr 3, 2018

PCC North, 100 Level, Room 131 B

Joseph KopanskiElectrical Engineer atNIST

CM01.01.04 : Molecular Rheology of Gold Nanojunctions

11:30 AM–11:45 AM Apr 3, 2018

PCC North, 100 Level, Room 131 B

Antoine Lainé

CM01.01.05 : Spectroscopy Based Mapping of Electrical Properties Using Fast Force Volume

11:45 AM–12:00 PM Apr 3, 2018

PCC North, 100 Level, Room 131 B

Peter De Wolf

CM01.01: Nanoelectrical SPM

10:30 AM–12:00 PM Apr 3, 2018

PCC North, 100 Level, Room 131 B

CM01.02.01 : CT-AFM—Nanoscale Tomography of Materials Properties

1:30 PM–2:00 PM Apr 3, 2018

PCC North, 100 Level, Room 131 B

Bryan HueyUniversity of Connecticut

CM01.02.02 : Subsurface Imaging of Biased Structures with Electrostatic Force Microscopy (EFM)

2:00 PM–2:15 PM Apr 3, 2018

PCC North, 100 Level, Room 131 B

Lin You

CM01.02.03 : Origin of Subsurface Contrast in Ultrasonic AFM—Wave Scattering or Contact Mechanics?

2:15 PM–2:30 PM Apr 3, 2018

PCC North, 100 Level, Room 131 B

Oleg KolosovProfessor atLancaster University

CM01.02: Subsurface Imaging

1:30 PM–3:30 PM Apr 3, 2018

PCC North, 100 Level, Room 131 B

CM01.03.01 : Recent Experiments with Scanning Thermal and Thermoelectric Microscopy

3:30 PM–4:00 PM Apr 3, 2018

PCC North, 100 Level, Room 131 B

David ChoiGraduate Research Assistant atThe University of Texas at Austin

CM01.03.02 : Scanning Thermal Microscopy—Investigation of Nanostructured Sample

4:00 PM–4:15 PM Apr 3, 2018

PCC North, 100 Level, Room 131 B

Nathalie TrannoyUniversity of Reims

CM01.03.03 : Scanning Thermal Microscopy for Local Thermometry and Thermal Conductance Measurements

4:15 PM–4:45 PM Apr 3, 2018

PCC North, 100 Level, Room 131 B

Bernd GotsmannIBM Research - Zurich

CM01.03.04 : Nano-Thermal Characterization of Polymers Using Highly Sensitive Thermocouple Based SThM Probes

4:45 PM–5:00 PM Apr 3, 2018

PCC North, 100 Level, Room 131 B

Ami ChandAppNano

CM01.03: Nanothermal SPM I

3:30 PM–5:00 PM Apr 3, 2018

PCC North, 100 Level, Room 131 B

CM01.04.01 : Exploring the Electronic and Optical Properties of Atomically Thin Materials by Scanning Probe Microscopy

8:00 AM–8:30 AM Apr 4, 2018

PCC North, 100 Level, Room 131 B

Cristina GiuscaSenior Research Scientist atNational Physical Laboratory, UK

CM01.04.02 : Importance of Nanoscale Spectral Imaging of Luminescent Excitons in 2D Semiconductors

8:30 AM–8:45 AM Apr 4, 2018

PCC North, 100 Level, Room 131 B

Mr. Andrey KrayevAfm-Raman Product Manager-Us atHoriba Scientific

CM01.04.03 : Direct Quantification of Defect Density in Monolayer WS2 and the Impact of Defect Density of Photoluminescence

8:45 AM–9:00 AM Apr 4, 2018

PCC North, 100 Level, Room 131 B

Matthew RosenbergerUniversity of Illinois Urbana at Champaign

CM01.04.03 : WITHDRAWN 1/30/2018 CM01.04.03 Scanning Thermal Microscopy Study of Supported 2D Materials—The Case of CVD Graphene

8:45 AM–9:00 AM Apr 4, 2018

PCC North, 100 Level, Room 131 B

Mauro TortelloPolitecnico di Torino

CM01.04.04 : Microwave Near-Field Imaging of 2D Semiconductor Devices

9:00 AM–9:15 AM Apr 4, 2018

PCC North, 100 Level, Room 131 B

Samuel BerwegerNIST