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LN02.05.01 : Soft Matter Design and Characterization in the Era of Machine Learning

10:15 AM–10:45 AM Apr 4, 2018 (America - Denver)

PCC West, 100 Level, Room 106 C

Juan de PabloProfessor atUniversity of Chicago
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CANCELLED EN18.11/NM03.09: Joint Session I: Photoelectrochemical Cells

1:30 PM–3:30 PM Apr 5, 2018 (America - Denver)

PCC North, 200 Level, Room 229 A

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CM01.01.01 : Kelvin Probe Force Microscopy of Molecular Adsorption/Desorption on Nanowires

10:30 AM–11:00 AM Apr 3, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Thomas ThundatUniversity of Alberta
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CM01.01.02 : The Relationship Between Carbon Nanotube Structure, Dielectric Environment and Physical Properties Revealed by Spectrally-Resolved Photocurrent Microscopy

11:00 AM–11:15 AM Apr 3, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Mitchell SengerStudent atOregon State University Dept. of Physics
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CM01.01.03 : Method for Determining the Electrical Shape of a Scanning Probe Microscope Tip

11:15 AM–11:30 AM Apr 3, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Joseph KopanskiElectrical Engineer atNIST
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CM01.01.04 : Molecular Rheology of Gold Nanojunctions

11:30 AM–11:45 AM Apr 3, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Antoine Lainé
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CM01.01.05 : Spectroscopy Based Mapping of Electrical Properties Using Fast Force Volume

11:45 AM–12:00 PM Apr 3, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Peter De Wolf
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CM01.01: Nanoelectrical SPM

10:30 AM–12:00 PM Apr 3, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

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CM01.02.01 : CT-AFM—Nanoscale Tomography of Materials Properties

1:30 PM–2:00 PM Apr 3, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Bryan HueyUniversity of Connecticut
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CM01.02.02 : Subsurface Imaging of Biased Structures with Electrostatic Force Microscopy (EFM)

2:00 PM–2:15 PM Apr 3, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Lin You
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CM01.02.03 : Origin of Subsurface Contrast in Ultrasonic AFM—Wave Scattering or Contact Mechanics?

2:15 PM–2:30 PM Apr 3, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Oleg KolosovProfessor atLancaster University
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CM01.02: Subsurface Imaging

1:30 PM–3:30 PM Apr 3, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

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CM01.03.01 : Recent Experiments with Scanning Thermal and Thermoelectric Microscopy

3:30 PM–4:00 PM Apr 3, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

David ChoiGraduate Research Assistant atThe University of Texas at Austin
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CM01.03.02 : Scanning Thermal Microscopy—Investigation of Nanostructured Sample

4:00 PM–4:15 PM Apr 3, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Nathalie TrannoyUniversity of Reims
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CM01.03.03 : Scanning Thermal Microscopy for Local Thermometry and Thermal Conductance Measurements

4:15 PM–4:45 PM Apr 3, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Bernd GotsmannIBM Research - Zurich
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CM01.03.04 : Nano-Thermal Characterization of Polymers Using Highly Sensitive Thermocouple Based SThM Probes

4:45 PM–5:00 PM Apr 3, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Ami ChandAppNano
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CM01.03: Nanothermal SPM I

3:30 PM–5:00 PM Apr 3, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

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CM01.04.01 : Exploring the Electronic and Optical Properties of Atomically Thin Materials by Scanning Probe Microscopy

8:00 AM–8:30 AM Apr 4, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Cristina GiuscaSenior Research Scientist atNational Physical Laboratory, UK
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CM01.04.02 : Importance of Nanoscale Spectral Imaging of Luminescent Excitons in 2D Semiconductors

8:30 AM–8:45 AM Apr 4, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Mr. Andrey KrayevAfm-Raman Product Manager-Us atHoriba Scientific
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CM01.04.03 : Direct Quantification of Defect Density in Monolayer WS2 and the Impact of Defect Density of Photoluminescence

8:45 AM–9:00 AM Apr 4, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Matthew RosenbergerUniversity of Illinois Urbana at Champaign
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