I am an applied material scientist with a focus on materials design and development for energy and aerospace applications. My two primary foci are the response of materials to environmental stimuli (irradiation, temperature, pressure, corrosive gases/liquids) and the role of interfaces/surfaces/defects, with the ultimate goal of realizing architected materials. I am an expert in advanced materials characterization (non-destructive and destructive) techniques including microscopy (TEM, SEM, EBSD, APT, AFM, uCT), diffraction (XRD, Neutron) , spectroscopy (Raman, XPS, EELS, EDS), and tomography. Within each of these techniques I am also a big data developer establishing efficient methods to realize the full potential of these technologies. My publication lists can be found on either ResearchGate (https://www.researchgate.net/profile/Jeffery_Aguiar) Google Scholar (https://scholar.google.com/citations?user=NkTFXHYAAAAJ&hl=en).