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Guy Cohen
Company
IBM T.J. Watson Research Center
Location
Yorktown Heights NY UNITED STATES
Networks
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Bio

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Meeting Program
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EP01.02.04 : Near Surface Depletion of Silicon Dopants in Epitaxially Grown Silicon Doped InAs

3:45 PM–4:00 PM Apr 3, 2018

PCC North, 200 Level, Room 224 A

Guy CohenIBM T.J. Watson Research Center
Interests
Composition & Microstructure - Bulk TechniquesX-Ray Diffraction (Xrd)
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Composition & Microstructure - Chemical ElementGe
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Composition & Microstructure - Chemical ElementSi
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Composition & Microstructure - Material TypeCrystalline
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Composition & Microstructure - Material TypeIii-V
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Composition & Microstructure - Material TypeNanoscale
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Composition & Microstructure - Surface TechniquesScanning Probe Microscopy (Spm)
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Composition & Microstructure - Surface TechniquesSecondary Ion Mass Spectroscopy (Sims)
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Performance - FunctionalityDevices
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Performance - FunctionalityElectronic Material
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Performance - FunctionalityMicroelectronics
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Performance - FunctionalitySemiconducting
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Performance - Material FormNanostructure
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Properties - TransportElectrical Properties
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Synthesis & Processing - DepositionAtomic Layer Deposition
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Synthesis & Processing - DepositionChemical Vapor Deposition (Cvd) (Deposition)
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Synthesis & Processing - DepositionEpitaxy
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Synthesis & Processing - DepositionIon-Implantation
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Synthesis & Processing - DepositionMolecular Beam Epitaxy (Mbe)
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Synthesis & Processing - GrowthCrystal Growth
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Synthesis & Processing - TransformationPhase Transformation