Search
Home
Meeting Program
Posters
Exhibitors
Speakers
Sponsors
My Profile
My Profile
Messages
My Schedule
My Notes
My Favorite Exhibitors
×
×
×
Guy Cohen
Company
IBM T.J. Watson Research Center
Location
Yorktown Heights NY UNITED STATES
Networks
None yet.
Bio
None provided.
Meeting Program
EP01.02.04 : Near Surface Depletion of Silicon Dopants in Epitaxially Grown Silicon Doped InAs
3:45 PM–4:00 PM Apr 3, 2018
(America - Denver)
PCC North, 200 Level, Room 224 A
Guy Cohen
IBM T.J. Watson Research Center
Interests
Composition & Microstructure - Bulk Techniques
X-Ray Diffraction (Xrd)
,
Composition & Microstructure - Chemical Element
Ge
,
Composition & Microstructure - Chemical Element
Si
,
Composition & Microstructure - Material Type
Crystalline
,
Composition & Microstructure - Material Type
Iii-V
,
Composition & Microstructure - Material Type
Nanoscale
,
Composition & Microstructure - Surface Techniques
Scanning Probe Microscopy (Spm)
,
Composition & Microstructure - Surface Techniques
Secondary Ion Mass Spectroscopy (Sims)
,
Performance - Functionality
Devices
,
Performance - Functionality
Electronic Material
,
Performance - Functionality
Microelectronics
,
Performance - Functionality
Semiconducting
,
Performance - Material Form
Nanostructure
,
Properties - Transport
Electrical Properties
,
Synthesis & Processing - Deposition
Atomic Layer Deposition
,
Synthesis & Processing - Deposition
Chemical Vapor Deposition (Cvd) (Deposition)
,
Synthesis & Processing - Deposition
Epitaxy
,
Synthesis & Processing - Deposition
Ion-Implantation
,
Synthesis & Processing - Deposition
Molecular Beam Epitaxy (Mbe)
,
Synthesis & Processing - Growth
Crystal Growth
,
Synthesis & Processing - Transformation
Phase Transformation