Multifunctional oxides like BiFeO3 are extensively studied for their properties and functionalities. In this study, the growth of (20nm) fully strained tetragonal (T), rhombohedral (R) and a mixed phase of T and R of Bismuth ferrite (BiFeO3) was achieved by varying the thickness of the template layer. The X-ray diffraction and ferroelectric/piezoelectric characterization revealed improved piezoelectric property in case of the sample with the mixed phase of BFO. An improved piezoelectric constant (d33) of ~45 pm/V is observed in the mixed phase sample compared with the fully strained tetragonal (~12 pm/V) and completely relaxed rhombohedral phase (~16 pm/V) grown on LAO substrate for the given thickness. Further, a tip-induced domain switching was performed along with the ferroelectric domain nucleation and growth. The nucleation of the domains begins from 4V DC bias applied through the tip. The ferroelectric domains study shows the 90o domains and 180o domains are present in the fully strained tetragonal sample with a dominant Out-of-Plane response. In case of the mixed phase, the in-plane response is also present with 180o, 90o, 71o, and 109o domain walls. The fully relaxed film has dominant 71o and 109o domain walls. This study is relevant in analyzing the domain dynamics when these number of domain walls are present together. Further, the conductive AFM studies are performed to reveal the role of domain boundaries in conductivity of the film.