Date/Time: 04-03-2018 - Tuesday - 05:00 PM - 07:00 PM
Jose Luis Casas Espinola1 Tetyana Torchynska1 Brahim el Filali1 Jorge Luis Ramírez García1

1, Instituto Politecnico Nacional, Ciudad de Mexico, FDM, Mexico

Photoluminescence spectroscopy (PL), X-Ray Diffraction (XRD) and Scanning Electron Microscopy (SEM) were used for the comparative characterization of ZnO and ZnO Er nanocrystals (NCs) obtained by spray pyrolysis method. High temperature annealing at 400 C for 2 hours in nitrogen flow follows the spray pyrolysis process. SEM study has confirmed the nanocrystal (NC) structure of obtained ZnO and ZnO Er films. X-Ray diffraction has revealed the wurtzite crystal structure in ZnO and ZnO Er NCs. The XRD intensity of all XRD peaks monotonically decreases with Er concentrations. PL spectra demonstrate the near band edge (NBE) and defect related PL bands in visible (2.0-3.0 eV) and infrared (0.80-0.85eV) spectral ranges: The PL spectra were studied in dependence on Er atom concentrations and at different temperatures within the range 10-300K for the identification the optical transition responsible for the emission bands. The applications of this semiconductor nanomaterial could be very useful as high temperature light emitting diodes

Meeting Program

5:00 PM–7:00 PM Apr 3, 2018 (America - Denver)

PCC North, 300 Level, Exhibit Hall C-E