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Siddharth Maddali1 Irene Calvo Almazn1 Peter Kenesei3 Jun-Sang Park3 Jonathan Almer3 Ross Harder3 Youssef Nashed2 Stephan Hruszkewycz1

1, Argonne National Laboratory, Lemont, Illinois, United States
3, Argonne National Laboratory, Lemont, Illinois, United States
2, Northwestern University, Evanston, Illinois, United States

Spatial resolution of strain in bulk polycrystal volumes requires coherent diffractive imaging (CDI) capabilities at high X-ray energies, typically greater than 50 keV. We describe here a data recovery scheme to treat coarsely resolved diffraction signals from such experiments. The general numerical methodology is applicable to scattering data collected under a variety of restrictive experimental conditions. Our method is detailed here in the context of Bragg-mode CDI measurements of a single crystal. We describe certain mathematical properties of the wave field from such a scatterer, and how these can be exploited to achieve a resolution of the signal that is not limited by the detector pixel size. Our focus specifically is on two variants of the conventional experimental setup, and how application of our numerical ‘sparse recovery’ method allows one to relax certain experimental constraints and affords one flexibility in the data acquisition process. We see the development of such enhanced signal processing tools as complementary to the current hardware upgrade programs at next-generation synchrotrons around the world.

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