Nobumichi Tamura1 Camelia Stan1 Kai Chen2

1, Lawrence Berkeley National Laboratory, Berkeley, California, United States
2, Xi'an Jiaotong University, Xi'an, , China

Progresses in area detector and x-ray optics technology combined with increased availability of high-end computational capabilities have transformed the relatively slow technique of scanning x-ray Laue microdiffraction at synchrotron facilities into a near real-time quantitative microstructural imaging tool enabling to rapidly map materials microstructure and deformation at the nanoscale in-situ. Fast data collection provided by state-of-the-art area detectors and fully automated diffraction pattern indexing algorithms optimized for speed make it possible to scan large portions of a sample and get quantitative images of the distribution of phases, crystal orientations (texture), misorientations, strains/stresses and defect densities. We will demonstrate the use of this technique to the study of laser 3D printed nickel-based superalloy samples.