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Nozomi Shirato1 Brian May3 Mark Wolfman3 Hao Chang2 1 Daniel Rosenmann1 Saw-Wai Hla1 2 Jordi Cabana3 Volker Rose1

1, Argonne National Laboratory, Lemont, Illinois, United States
3, University of Illinois at Chicago, Chicago, Illinois, United States
2, Ohio University, Athens, Ohio, United States

Low temperature scanning tunneling microscopy (STM) combined with synchrotron based X-rays is a surface sensitive technique to measure elemental, chemical and magnetic contrast at unprecedented resolution. A functionalized tip at a tip-sample junction works as a detector to collect localized information. Recently, we demonstrated that the technique can be utilized to obtain chemical fingerprint of monolayer metal islands [1] and localized magnetic contrast by utilizing polarized beams [2]. Here, we present measurements of chemical distributions on a battery anode material using SX-STM technique. The capability to probe depth sensitive chemical information at high spatial resolution opens door to study localized chemistry on surfaces.

References
[1] N. Shirato et al., Nano Letters 14, 6499 (2014).
[2] A. DiLullo et al., J. Synchrotron Rad. 23, 574 (2016).

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