3, University of Illinois at Chicago, Chicago, Illinois, United States
2, Ohio University, Athens, Ohio, United States
Low temperature scanning tunneling microscopy (STM) combined with synchrotron based X-rays is a surface sensitive technique to measure elemental, chemical and magnetic contrast at unprecedented resolution. A functionalized tip at a tip-sample junction works as a detector to collect localized information. Recently, we demonstrated that the technique can be utilized to obtain chemical fingerprint of monolayer metal islands  and localized magnetic contrast by utilizing polarized beams . Here, we present measurements of chemical distributions on a battery anode material using SX-STM technique. The capability to probe depth sensitive chemical information at high spatial resolution opens door to study localized chemistry on surfaces.
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 A. DiLullo et al., J. Synchrotron Rad. 23, 574 (2016).