X-ray Bragg coherent diffraction imaging has evolved into a powerful tool for local structure and strain characterization at the nanoscale. Unencumbered by high resolution x-ray optics, or stringent sample preparation requirements, the technique has enabled imaging of strain in nano-scale materials at operando conditions. By measuring the coherent scattering in the vicinity of a Bragg peak of a crystal lattice and computationally inverting to an image, the technique has demonstrated quantitative strain resolution at the 10^-4 level with sub 10nm spatial resolution.
This talk will introduce the method and describe details of the coherent diffraction measurements and image retrieval process. I will also present a handful of recent studies performed at the Advanced Photon Source at Argonne National Laboratory strain imaging was used to elucidate the mechanisms underlying catalytic activity in gold nanocrystals and the mechanisms of damage under focused ion beam milling.