2018 MRS Spring Meeting - Session Details

Laurene Tetard, University of Central Florida
Oleg Kolosov, Lancaster University
Fabian Menges, University of Colorado Boulder
Michael Molinari, Universite de Reims Champagne Ardenne

Symposium Support:

SPECS-TII, Inc.

Sub-Sessions ( See all )

CM01.04.01 : Exploring the Electronic and Optical Properties of Atomically Thin Materials by Scanning Probe Microscopy

8:00 AM–8:30 AM Apr 4, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Cristina GiuscaSenior Research Scientist atNational Physical Laboratory, UK

CM01.04.02 : Importance of Nanoscale Spectral Imaging of Luminescent Excitons in 2D Semiconductors

8:30 AM–8:45 AM Apr 4, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Mr. Andrey KrayevAfm-Raman Product Manager-Us atHoriba Scientific

CM01.04.03 : Direct Quantification of Defect Density in Monolayer WS2 and the Impact of Defect Density of Photoluminescence

8:45 AM–9:00 AM Apr 4, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Matthew RosenbergerUniversity of Illinois Urbana at Champaign

CM01.04.03 : WITHDRAWN 1/30/2018 CM01.04.03 Scanning Thermal Microscopy Study of Supported 2D Materials—The Case of CVD Graphene

8:45 AM–9:00 AM Apr 4, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Mauro TortelloPolitecnico di Torino

CM01.04.04 : Microwave Near-Field Imaging of 2D Semiconductor Devices

9:00 AM–9:15 AM Apr 4, 2018 (America - Denver)

PCC North, 100 Level, Room 131 B

Samuel BerwegerNIST